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1 Analysis of optical thickness determination of materials by THz-TDS [会议论文]

作者:Sushko, O.^1, Dubrovka, R.^1, Donnan, R.S.^1

关键词:Dielectric response;Extraction procedure;...

会议举办机构:School of Electronic Engineering and Computer Science, Queen Mary University of London, Mile End Road, E1 4NS, London, United Kingdom^1

会议时间:

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2 Switched Fault Diagnosis Approach for Industrial Processes based on Hidden Markov Model [会议论文]

作者:Wang, Lin^1;Yang, Chunjie^1;Sun, Youxian^1;等

关键词:Data characteristics;Extraction procedure;...

会议举办机构:State Key Laboratory of Industrial Control Technology, Institute of Industrial Processes Control, Zhejiang University, Hangzhou, Zhejiang, China^1

会议时间:2015

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3 Development of a Solid-Phase Microextraction-Surface-Enhanced Raman Scattering Approach to Detect Ferbam [会议论文]

作者:Wang, Shan^1;Zhao, Jinhui^1;Wu, Guoqiang^1;等

关键词:Extraction procedure;Facile method;...

会议举办机构:School of Food Science and Technology, Jiangxi Agricultural University, Nanchang

会议时间:2019

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